Log-likelihood ratio test for improving accuracy in silicon spin qubit readout

Publication Information

Title

Japanese:
English:	Log-likelihood ratio test for improving accuracy in silicon spin qubit readout

Author

Japanese:	溝口来成, 和田陸久, 松岡竜太郎, 太田俊輔, I. Yanagi, T. Mine, 土屋龍太, 久本大, 水野弘之, 小寺哲夫.
English:	Raisei Mizokuchi, Riku Wada, Ryutaro Matsuoka, Shunsuke Ota, I. Yanagi, T. Mine, Ryuta Tsuchiya, Digh Hisamoto, H. Mizuno, Tetsuo Kodera.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Dec. 16, 2026

Publisher

Japanese:
English:

Conference name

Japanese:
English:	1st International Workshop on Industrial-grade Ge Quantum Technology (InGeQT workshop 2025)

Conference site

Japanese:
English:	Osaka