Measurement of cross-correlated charge noise spectrum from transport currents through series-coupled silicon quantum dots

Publication Information

Title

Japanese:
English:	Measurement of cross-correlated charge noise spectrum from transport currents through series-coupled silicon quantum dots

Author

Japanese:	松岡竜太郎, 松田達也, 土屋龍太, T. Mine, 久本大, 水野弘之, 溝口来成, 小寺哲夫, 米田淳.
English:	R. Matsuoka, T. Matsuda, R. Tsuchiya, T. Mine, D. Hisamoto, H. Mizuno, R. Mizokuchi, T. Kodera, J. Yoneda.

Language

English

Journal/Book name

Japanese:
English:	Appl. Phys. Lett

Volume, Number, Page

Vol. 128 224002

Published date

June 4, 2026

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: