Performance of the one-dimensional multichannel array of the CdTe hard x-ray detectors
著者
和文:
Sakamoto, T.,
河合 誠之,
Mihara, T.,
Morii, M.,
Kato, H. ..
英文:
Sakamoto, T.,
Kawai, N.,
Mihara, T.,
Morii, M.,
Kato, H. ..
言語
English
掲載誌/書名
和文:
英文:
X-Ray and Gamma-Ray Instrumentation for Astronomy XIII. Edited by Flanagan, Kathryn A.; Siegmund, Oswald H. W. Proceedings of the SPIE, Volume 5165, pp. 73-84 (2004).
We made one-dimensional detector arrays applying the newly developed Schottky CdTe technique. Two prototypes are manufactured; one consists of eight pixels of 2 x 2 x 0.5 mm3 each (2 mm module) and the other eight pixels of 25 x 2 x 0.5 mm3 each (25 mm module). The single element read-out test of the 2 mm module showed an energy resolution of ~1.7 keV at 59.5 keV, at 0°C for the bias voltage of 400 V. The 25 mm modules showed an energy resolution of ~4.5 keV at 59.5 keV at 0°C for the bias voltage of 300 V. Signals from the four sets of the CdTe modules (32 pixels in total) are read out by the VA/TA chips made by IDE company. The energy resolution of the 2 mm module is ~3.0 keV on average at 59.5 keV at room temperature for the bias voltage of 350 V. The 25 mm modules have an energy resolution of ~6.1 keV on average at 122.1 keV at room temperature for the bias voltage of 300 V. In view of these results, the manufactured arrays are promising as spectroscopic detectors for hard X-rays and γ-rays. A few modifications are needed in the VA/TA chips to be applied for the CdTe X-ray detector. Applications of CdTe detector arrays to a slit or coded-mask camera, and an imaging polarimeter are stated.
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