We tried to relate the relaxation currents of Pt/62-nm-thick (Ba0.5Sr0.5)TiO3/Pt capacitors to the results of ultraviolet photoemission spectroscopic measurements for the 62-nm-thick (Ba0.5Sr0.5)TiO3/Pt specimens. The slowest relaxation (159-313 s at applied voltages of 1.5-3 V, and at a measuring temperature of 40 degrees centigrade) and the relatively faster relaxations (4.92-5.43 s and 0.25-0.46 s) were assigned as the electron-detrapping from the localized state at 0.80 eV below the quasi-Fermi level, from the localized state at 0.55 eV below the quasi-Fermi level, and from the localized state at 0.30 eV below the quasi-Fermi level, respectively. The decreasing of relaxation time in accordance with the increasing of bias voltage is probably due to the decreasing of depletion width. The decreasing of depletion width is probably due to the detrapping of electrons from deep localized states in accordance with the downward bending of quasi-Fermi level in the depletion layer, and due to the decreasing of relative dielectric constant in the depletion layer in accordance with the increasing of bias voltage.
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