Fluorescence intermittency (blinking) of semiconductor nanocrystals (NCs) is interpreted in terms of single photon-counting at high temporal resolution of tens of kiloframes per second (kfps) by fast imaging on ZnS- overcoated CdSe (CdSe/ZnS) NCs. We report herein a characterization method based on the threshold resulting from a double exponential distribution as a function of the photon interval to discriminate between “on” (bright) and “off ” (dark) states. Histograms of both the resolved “on” and “off ” lengths show that they obey single Poisson distributions with their duration constants, contrary to the conventional power-law distributions. We suggest that this characterization gives us more potential power to elucidate blinking kinetics of single CdSe/ZnS NCs on their physicochemical surroundings.
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