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タイトル
和文: 
英文:Characterization of thiol-functionalized oligo(phenylene-ethynylene)-protected Au nanoparticles by scanning tunneling microscopy and spectroscopy 
著者
和文: Hyunmo Koo, 加納 伸也, 田中 大輔, 坂本 雅典, 寺西 利治, Gyoujin Cho, 真島 豊.  
英文: Hyunmo Koo, Shinya Kano, Daisuke Tanaka, Masanori Sakamoto, Toshiharu Teranishi, Gyoujin Cho, Yutaka Majima.  
言語 English 
掲載誌/書名
和文: 
英文:Appl. Phys. Lett. 
巻, 号, ページ Vol. 101        p. 083115-1-5
出版年月 2012年8月23日 
出版者
和文: 
英文:American Institute of Physics 
会議名称
和文: 
英文: 
開催地
和文: 
英文: 
ファイル
DOI https://doi.org/10.1063/1.4747720
アブストラクト The electrical properties of Au nanoparticles protected by thiol-functionalized olig (phenyleneethynylene) (OPE), 1,4-bis-(3-mercapto phenylethynyl)benzene have been investigated by scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS). The STM and scanning electron microscopy images of chemisorbed OPE-protected Au nanoparticles on Au(111) surface were similar, and the densities were almost identical. OPE-protected Au nanoparticles exhibited stochastic conductance switching behaviors, and current-voltage (I–V) and log I–V characteristics by STS at 100K showed Coulomb blockade behaviors. The charging energy of Au nanoparticles was as high as 0.57 eV when the core diameter was 2.1 nm. Our results are significant for single-electron transistor memory applications.

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