Thickness dependent electronic structure of La0.6Sr0.4MnO3 layer in SrTiO3/La0.6Sr0.4MnO3 /SrTiO3 heterostructures studied by hard x-ray photoemission spectroscopy
The authors have investigated changes in the electronic structures of digitally controlled
La0.6Sr0.4MnO3 LSMO layers sandwiched between SrTiO3 as a function of LSMO layer thickness in terms of hard x-ray photoemission spectroscopy HX-PES. The HX-PES spectra show the evolution of Mn 3d derived states near the Fermi level and the occurrence of metal-insulator transition at 8 ML. The detailed analysis for the thickness dependent HX-PES spectra reveals the existence of the less conducting and nonmagnetic transition layer with a film thickness of about 4 ML in the interface region owing to significant interaction through the interface.
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