The characterization of Zr oxide layer formed in Ar and O2 gas mixture at 973 K on the surface of Zr metal was characterized
by electrochemical impedance spectroscopy (EIS). The increase of the layer thickness and the formation of the horizontal crack
in the layer were evaluated insitu using EIS. The thickness of the Zr oxide layer estimated by EIS agreed well with that by
EPMA analysis. It was found that the time constant t of the Zr oxide layer obtained by the EIS increased with the oxidation time.
This trend indicated the growth of horizontal crack. The constant phase element (CPE) parameter p was obtained from the
results of EIS. The change of p indicated that the Zr oxide layer has the gradient of the chemical composition in its thickness direction.
The single horizontal crack and compositionally gradient in the oxide layer was modeled as they electrically functioned in the
equivalent circuits. The simulation results indicated that the EIS method can be used as the insitu monitor the gradient of the
chemical composition and the crack formation in the oxide layer.
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