Investigation of Effects of Applied Voltage on Effective Young’s modulus of Ti/Au Multi-Layered Micro-Cantilevers” New Method of Damage and Failure Analysis of Structural Part

論文・著書情報

タイトル

和文:
英文:	Investigation of Effects of Applied Voltage on Effective Young’s modulus of Ti/Au Multi-Layered Micro-Cantilevers” New Method of Damage and Failure Analysis of Structural Part

著者

和文:	渡邉春海, 栗岡智行, 陳君怡, Chang Tso-Fu Mark, TENNETI DEVI, 町田克之, 伊藤浩之, 三宅美博, 曽根正人.
英文:	Shunkai Watanabe, Tomoyuki Kurioka, Chun-Yi Chen, Tso-Fu Mark Chang, Tenneti Devi Srujana, Katsuyuki Machida, Hiroyuki Ito, Yoshihiro Miyake, Masato Sone.

言語

English

掲載誌/書名

和文:
英文:	New Method of Damage and Failure Analysis of Structural Part

巻, 号, ページ

出版年月

2024年10月14日

出版者

和文:
英文:	CPIT2024, New Method of Damage and Failure Analysis of Structural Part

会議名称

和文:
英文:	CPIT2024, New Method of Damage and Failure Analysis of Structural Part

開催地

和文:
英文:	OSTRAVA,