論文

• Suhyun Kim, Yoshifumi Oshima, Yasumasa Tanishiro, Kunio Takayanagi. Study on probe current dependence of the intensity distribution in annular dark field images, ULTRAMICROSCOPY, Vol. 121, pp. 38-41, June 2012.
• K. Takayanagi, S. Kim, S. Lee, Y. Oshima, T. Tanaka, Y. Tanishiro, H. Sawada, F. Hosokawa, T. Tomita, T. Kaneyama, Yukihito Kondo. Electron microscopy at a sub-50 pm resolution, J. Electron Microsc., Oxford Journals, Vol. 60, No. suppl 1, pp. S239 - S244, Aug. 2011.
• S. Kim, Y. Oshima, H. Sawada, T. Kaneyama, Y. Kondo, M. Takeguchi, Yoshiko Nakayama, Y. Tanishiro, K. Takayanagi. Quantitative Annular Dark-field STEM Images of a Silicon Crystal Using a Large-angle Convergent Electron Probe with a 300-kV Cold Field-emission Gun, J. Electron Microsc., Oxford Journals, Vol. 60, No. 2, pp. 109-116, Jan. 2011.
• Suhyun Kim, Yoshifumi Oshima, Hidetaka Sawada, Naoto Hashikawa, Kyoichiro Asayama, Tosikatu Kaneyama, Yukihito Kondo, Yasumasa Tanishiro, Kunio Takayanagi. A Dopant Culster in a Highly Antimony Doped Silicon Crystal, Applied Physics Express, The Japan Society of Applied Physics, Vol. 3, No. 8, p. 081301, July 2010.  公式リンク  
  

[ BibTeX 形式で保存 ]    [ 論文・著書をCSV形式で保存 ]    [ 特許をCSV形式で保存 ]