論文

• M. Ohtani, T. Fukumura, M. Kawasaki, K. Omote, T. Kikuchi, J. Harada, A. Ohtomo, M. Lippmaa, T. Ohnishi, D. Komiyama, R. Takahashi, Y. Matsumoto, H. Koinuma. Concurrent x-ray diffractometer for high throughput structural diagnosis of epitaxial thin films, Applied Physics Letters, Vol. 79, No. 22, pp. 3594-3596, Nov. 2001.  公式リンク  
  
• T. Ohnishi, D. Komiyama, T. Koida, S. Ohashi, C. Stauter, H. Koinuma, A. Ohtomo, M. Lippmaa, N. Nakagawa, M. Kawasaki, T. Kikuchi, K. Omote. Parallel integration and characterization of nanoscaled epitaxial lattices by concurrent molecular layer epitaxy and diffractometry, Applied Physics Letters, Vol. 79, No. 4, pp. 536-538, July 2001.  公式リンク  
  

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