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論文
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Yasutake Ohishi,
Kiyomichi Araki,
S. Kimura,
M. Nakamura,
K. Nagai,
E. Fukuda,
Y. Daio.
Efficient Method to Measure IMD of Power Amplifier with Simplified Phase Determination Procedure to Clarify Memory Effect Origins,
IEICE Transaction on Electronics,
vol. E93-C,
no. 7,
pp. 991-999,
July 2010.
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