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研究業績一覧 (1件)
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国際会議発表 (査読有り)
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M. Mamatrishat,
Miyuki Kouda,
Takamasa Kawanago,
Kuniyuki KAKUSHIMA,
Ahmet Parhat,
A. Aierken,
KAZUO TSUTSUI,
西山彰,
Nobuyuki Sugii,
KENJI NATORI,
HIROSHI IWAI.
Effect of Remote-Surface –Roughness Scattering on Electron Mobility in MOSFETs with High-k Dielectrics,
ECS 218th Meeting,
Oct. 2010.
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