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YOUNGSUKKIM 2016年 研究業績一覧 (1件 / 8件)
国際会議発表 (査読有り)
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Y. S. Kim,
S. Kodama,
Y. Mizushima,
T. Nakamura,
N. Maeda,
K. Fujimoto,
A. Kawai,
T. Ohba.
Warpage-free Ultra-Thinning ranged from 2 to 5-μm for DRAM Wafers and Evaluation of Devices Characteristics,
2016 IEEE 66th Electronic Components and Technology Conference,
Electronic Components and Technology Conference (ECTC), 2016 IEEE 66th,
IEEE,
pp. 1471-1476,
June 2016.
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