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Title
Japanese:極微光デバイス製作のための反応性イオンビームエッチングに関する研究 
English:A Study of Reactive Ion Beam Etching Process for Optoelectronic Micro-Devices 
Author
Japanese: 松谷晃宏.  
English: akihiro matsutani.  
Type
Type:Thesis (Ph.D.) 
Country:Japan 
Language English 
Organization name Tokyo Institute of Technology 
Report number 乙第3270号 
Conferred date 1999/02/28 
Judge  
File   

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