Journal Paper

• Tomohide Morikawa, Masanori Kodera, Takao Shimizu, Keisuke Ishihama, Yoshitaka Ehara, Osami Sakata, Hiroshi Funakubo. Domain structure of PbTiO3 and Pb(Zr, Ti)O3 thin films controlled by tensile strain induced from Sr(Zr,Ti)O3 buffer layer, Appl. Phys. Lett., vol. 124, pp. 032901, Jan. 2024.

Domestic Conference (Not reviewed / Unknown)

• Keisuke Ishihama, Kazuki Okamoto, Tomohide Morikawa, HIROSHI FUNAKUBO, Masanori Kodera, Shimizu Takao, 小金澤智之, 仲谷友孝, O. Sakata. 強誘電体ドメイン構造制御に向けたペロブスカイト型Sr(Zr,Ti)O3バッファ層の作製, 日本セラミックス協会 2024年年会, Mar. 2024.
• Miki Nakahata, Kazuki Okamoto, Keisuke Ishihama, Shimizu Takao, 小金澤智之, 仲谷友孝, O. Sakata, Tomoaki Yamada, HIROSHI FUNAKUBO. (100)/(001)配向正方晶Pb(Zr,Ti)O3膜における結晶構造のその場観察, 第71回応用物理学会春季学術講演会, Mar. 2024.

Patent

• HIROSHI FUNAKUBO, TakaoShimizu, Miyu Hasegawa, Keisuke Ishihama. 誘電性薄膜、誘電性薄膜素子、圧電アクチュエータ、圧電センサ、ヘッドアセンブリ、ヘッドスタックアセンブリ、ハードディスクドライブ、プリンタヘッド、及びインクジェットプリンタ装置. Patent. Registered. 国立大学法人東京工業大学, ＴＤＫ株式会社. 2019/09/11. 特願2020-546060. 2021/09/30. 再表2020/054779. 特許第7515113号. 2024/07/04 2024.

Degree

• Study on domain structure induced by stress and its impact to piezoelectric property in perovskite-type ferroelectric films,  Thesis,  Doctor (Engineering),  Tokyo Institute of Technology,  2024/03/26, 
• Study on domain structure induced by stress and its impact to piezoelectric property in perovskite-type ferroelectric films,  Outline,  Doctor (Engineering),  Tokyo Institute of Technology,  2024/03/26,   
• Study on domain structure induced by stress and its impact to piezoelectric property in perovskite-type ferroelectric films,  Summary,  Doctor (Engineering),  Tokyo Institute of Technology,  2024/03/26,   
• Study on domain structure induced by stress and its impact to piezoelectric property in perovskite-type ferroelectric films,  Exam Summary,  Doctor (Engineering),  Tokyo Institute of Technology,  2024/03/26,   

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