論文

• "Chunmeng Dou", "Tomoya Shoji", "Kazuhiro Nakajima", "Kuniyuki Kakushima", "Parhat Ahmet", "Yoshinori Kataoka", "Akira Nishiyama", "Nobuyuki Sugii", "Hitoshi Wakabayashi", "Kazuo Tsutsui", "Kenji Natori", "Hiroshi Iwai". Characterization of interface state density of three-dimensional Si nanostructure by charge pumping measurement, Microelectronics Reliability, Vol. 54, pp. 725-729, Apr. 2014.

国際会議発表 (査読有り)

• S. Kano, C. Dou, M. Hadi, K. Kakushima, P. Ahmet, A. Nishiyama, N. Sugii, K. Tsutsui, Y. Kataoka, K. Natori, E. Miranda, T. Hattori, H. Iwai. Influence of Electrode Material for CaOx Based Resistive Switching, China Semiconductor Technology International Conference (CSTIC), Mar. 2012.

国内会議発表 (査読なし・不明)

• Chunmeng Dou, Kakushima, Y. Kataoka, A. Nishiyama, N. Sugii, H. Wakabayashi, K. Tsutsui, K. Natori, H. Iwai. Determination of oxide traps distribution in high-k/InGaAs MOS capacitor by capacitance-voltage measurement, The Workshop on Future Trend of Nanoelectronics: WIMNACT 39, Feb. 2014.

学位論文

• A study on interface traps and near interfacial bulk traps at the interfaces of dielectric/semiconductor and semiconductor heterojunction,  Thesis,  Doctor (Engineering),  Tokyo Institute of Technology,  2014/03/26,   
• A study on interface traps and near interfacial bulk traps at the interfaces of dielectric/semiconductor and semiconductor heterojunction,  Summary,  Doctor (Engineering),  Tokyo Institute of Technology,  2014/03/26,   
• A study on interface traps and near interfacial bulk traps at the interfaces of dielectric/semiconductor and semiconductor heterojunction,  Exam Summary,  Doctor (Engineering),  Tokyo Institute of Technology,  2014/03/26,   

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