国際会議発表 (査読有り)

• Hidekazu Takahashi, Hiroki Ogura, Shimpei Sato, Atsushi Takahashi, Chikaaki Kodama. A feature selection method for weak classifier based hotspot detection, Proc. SPIE 11328, Design-Process-Technology Co-optimization for Manufacturability XIV, 113281E, pp. 1-7, Mar. 2020.
• Atsushi Takahashi, Hidekazu Takahashi, Hiroki Ogura, Shimpei Sato. Hotspot Detection Methods and their Evaluation in Advanced Lithography, Proc. the 16th International SoC Design Conference (ISOCC '19), p. 121, Oct. 2019.
• Atsushi Takahashi, Shimpei Sato, Hiroki Ogura, Yu-Min Sung, Ting-Chi Wang. Pattern Similarity Metrics for Layout Pattern Classification and their Validity Analysis by Lithographic Responses, Proc. 2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), pp. 494-497, July 2018.

国内会議発表 (査読なし・不明)

• 小椋弘貴, 高橋秀和, 佐藤真平, 高橋篤司. ホットスポットテストケースに用いられるデータベースの分析, 電子情報通信学会技術研究報告, Vol. 119, No. 282, pp. 191-196, Nov. 2019.

[ BibTeX 形式で保存 ]    [ 論文・著書をCSV形式で保存 ]    [ 特許をCSV形式で保存 ]