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丸明史 2022年 研究業績一覧 (1件 / 6件)
論文
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Akifumi Maru,
Akifumi Matsuda,
Satoshi Kuboyama,
Mamoru Yoshimoto.
Simulation-Based Understanding of “Charge-Sharing Phenomenon” Induced by Heavy-Ion Incident on a 65nm Bulk CMOS Memory Circuit,
IEICE Transactions on Electronics,
Institute of Electronics, Information and Communications Engineers (IEICE),
E105.C,
1,
47-50,
Jan. 2022.
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