High-throughput Evaluation of Crystallization Temperature of Pd-Cu-Si System Using Integrated Thin Film Samples

Publication Information

Title

Japanese:
English:	High-throughput Evaluation of Crystallization Temperature of Pd-Cu-Si System Using Integrated Thin Film Samples

Author

Japanese:	青野祐子, 櫻井淳平, 下河邉明, 秦誠一.
English:	Yuko Aono, Junpei Sakurai, Akira Shimokohbe, Seiichi Hata.

Language

English

Journal/Book name

Japanese:
English:	Technical Abstract of the 7th Pacific Rim International Conference on Advanced Materials and Processing

Volume, Number, Page

p. 90

Published date

Aug. 2010

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:	Cairns