Characterization of Hydrogenated Amorphous Silicon and Hydrogenated and Fluorinated Amorphous Silicon Carbid-Hetero-Junction by in-situ X-ray Photoelectron Spectroscopy
著者
和文:
Y. Matsuzaki,
T. Ohtaki,
M. Fujishima,
Y. Yoshida,
M. Kawasaki,
H. koinuma.
英文:
Y. Matsuzaki,
T. Ohtaki,
M. Fujishima,
Y. Yoshida,
M. Kawasaki,
H. koinuma.
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