Development of scanning microwave microscope with a lumped-constant resonator probe for high-throughput characterization of combinatorial dielectric materials
著者
和文:
N. Okazaki,
H. Odagawa,
Y. Cho,
T. Nagamura,
D. Komiyama,
T. Koida,
H. Minami,
P. Ahmet,
T. Fukumura,
Y. Matsumoto,
M. Kawasaki,
T. Chikyow,
H. Koinuma,
T. Hase.
英文:
N. Okazaki,
H. Odagawa,
Y. Cho,
T. Nagamura,
D. Komiyama,
T. Koida,
H. Minami,
P. Ahmet,
T. Fukumura,
Y. Matsumoto,
M. Kawasaki,
T. Chikyow,
H. Koinuma,
T. Hase.
ヘルプ