Journal Paper

• Moataz Eissa, Ryuya Sasaki, Tsuyoshi Horikawa, Tomohiro Amemiya, Nobuhiko Nishiyama. Wafer and chip-level characterization of edge-coupled photonic integrated circuits by cascaded grating couplers and spot-size converters, Japanese Journal of Applied Physics, Vol. 63, No. 7, July 2024.  Official location  

Domestic Conference (Not reviewed / Unknown)

• Shaher Anis Mahmoud Eissa Moataz, Ryuya Sasaki, Tsuyoshi Horikawa, Tomohiro Amemiya, Nobuhiko Nishiyama. Coupling structure for enabling both wafer- and chip-level characterization of silicon photonic integrated circuits, IEEE SiPhotonics 2024, Proceedings of IEEE SiPhotonics 2024, IEEE, Apr. 2024.

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