|
丸明史 研究業績一覧 (6件)
論文
-
Akifumi Maru,
Akifumi Matsuda,
Satoshi Kuboyama,
Mamoru Yoshimoto.
Simulation-Based Understanding of “Charge-Sharing Phenomenon” Induced by Heavy-Ion Incident on a 65nm Bulk CMOS Memory Circuit,
IEICE Transactions on Electronics,
Institute of Electronics, Information and Communications Engineers (IEICE),
E105.C,
1,
47-50,
Jan. 2022.
公式リンク
国内会議発表 (査読なし・不明)
学位論文
-
Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices,
Thesis,
Doctor (Engineering),
Tokyo Institute of Technology,
2021/09/24,
-
Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices,
Summary,
Doctor (Engineering),
Tokyo Institute of Technology,
2021/09/24,
-
Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices,
Exam Summary,
Doctor (Engineering),
Tokyo Institute of Technology,
2021/09/24,
[ BibTeX 形式で保存 ]
[ 論文・著書をCSV形式で保存
]
[ 特許をCSV形式で保存
]
|