論文

• Kay Domen, Takaya Miyase, Katsumi Abe, Hideo Hosono, Toshio Kamiya. Positive Gate Bias Instability Induced by Diffusion of Neutral Hydrogen in Amorphous In–Ga–Zn–O Thin-Film Transistor, IEEE Electron Dev. Lett., Vol. 35, pp. 832-834, 2014.
• Takaya Miyase, Ken Watanabe, Isao Sakaguchi, Naoki Ohashi, Kay Domen, Kenji Nomura, Hidenori Hiramatsu, Hideya Kumomi, Hideo Hosono, Toshio Kamiya. Roles of Hydrogen in Amorphous Oxide Semiconductor In-Ga-Zn-O: Comparison of Conventional and Ultra-High-Vacuum Sputtering, ECS J. Solid State Sci. Technol., Vol. 3, pp. Q3085-Q3090, 2014.
• K. Domen, T. Miyase, K. Abe, H. Hosono, T. Kamiya. Positive-Bias Stress Test on Amorphous In–Ga–Zn–O Thin Film Transistor: Annealing-Temperature Dependence, J. Displ. Technol., Vol. 10, pp. 975-978, 2014.

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