Journal Paper

• Takumi Uezono, Kazuya Masu, Takashi Sato. A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation, IEICE Transactions on Fundamentals of Electronics, IEICE Transactions on Fundamentals of Electronics, vol. E93-C, no. 3, pp. 324–331, Mar. 2010.
• Koh Yamanaga, Shuhei Amakawa, Kazuya Masu, Takashi Sato. A Universal Equivalent Circuit Model for Ceramic Capacitors, IEICE Transactions on Fundamentals of Electronics, IEICE Transactions on Fundamentals of Electronics, IEICE Transactions on Fundamentals of Electronics, Vol. E93-C, No. 3, pp. 347-354, Mar. 2010.

International Conference (Reviewed)

• Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato. Scan Based Process Parameter Estimation Through Path-Delay Inequalities, IEEE International Symposium on Circuits and Systems (ISCAS 2010), IEEE International Symposium on Circuits and Systems (ISCAS 2010), IEEE International Symposium on Circuits and Systems (ISCAS 2010), June 2010.  Official location  
• Takashi Sato, Takumi Uezono, Noriaki Nakayama, Kazuya Masu. Decomposition of Drain-Current Variation Into Gain-Factor and Threshold Voltage Variations, IEEE International Symposium on Circuits and Systems (ISCAS 2010), IEEE International Symposium on Circuits and Systems (ISCAS 2010), IEEE International Symposium on Circuits and Systems (ISCAS 2010), May 2010.
• Shiho Hagiwara, Koh Yamanaga, Ryo Takahashi, Kazuya Masu, Takashi Sato. Linear Time Calculation of State-Dependent Power Distribution Network Capacitance., International Symposium on Quality Electronic Design (ISQED), International Symposium on Quality Electronic Design (ISQED), International Symposium on Quality Electronic Design (ISQED), pp. 75-80, Mar. 2010.
• Takanori Date, Shiho Hagiwara, Kazuya Masu, Takashi Sato. Robust importance sampling for efficient SRAM yield analysis, International Symposium on Quality Electronic Design (ISQED), International Symposium on Quality Electronic Design (ISQED), International Symposium on Quality Electronic Design (ISQED), pp. 15-21, Mar. 2010.

Domestic Conference (Reviewed)

• Takanori Date, Shiho Hagiwara, Kazuya Masu, Takashi Sato. 超球の一部を用いた歩留り推定における不良領域の効率的探索手法, VLSI設計技術研究会，電子情報通信学会技術研究報告, VLSI設計技術研究会，電子情報通信学会技術研究報告, VLSI設計技術研究会，電子情報通信学会技術研究報告, pp. 37-42, Mar. 2010.

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