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Publication List - Nobuyasu Beppu (14 entries)
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Journal Paper
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Aya Shindome,
Yu Doioka,
Nobuyasu Beppu,
Shunri Oda,
Ken Uchida.
Experimental Study of Two-Terminal Resistive Random Access Memory Realized in Mono- and Multilayer Exfoliated Graphene Nanoribbons,
Japanese Journal of Applied Physics,
Vol. 52,
pp. 04CN05 (5 pages),
Mar. 2013.
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Tsunaki Takahashi,
Nobuyasu Beppu,
Kunro Chen,
Shunri Oda,
Ken Uchida.
Self-Heating Effects and Analog Performance Optimization of Fin-Type Field-Effect Transistors,
Japanese Journal of Applied Physics,
Vol. 52,
pp. 04CC03 (6 pages),
Feb. 2013.
International Conference (Reviewed)
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N. Beppu,
T. Takahashi,
S Oda,
K. Uchida.
Experimental Study of Self-Heating Effect (SHE) in SOI MOSFETs: Accurate Understanding of Temperatures During AC Conductance Measurement, Proposals of 2ω Method and Modified Pulsed IV,
IEDM 2012,
pp. 641-644,
2012.
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T. Takahashi,
K.Chen,
N.Beppu,
S. Oda,
K. Uchida.
Thermal-Aware Device Design of Nanoscale Bulk/SOI FinFETs: Suppression of Operation Temperature and Its Variability,
IEDM2011,
34.6,
Dec. 2011.
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T. Ohashi,
T. Takahashi,
N. Beppu,
S. Oda,
K. Uchida.
Experimental Evidence of Increased Deformation Potential at MOS Interface and its Impact on Characteristics of ETSOI FETs,
IEDM2011,
No. 16.4,
Dec. 2011.
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T. Takahashi,
N. Beppu,
K. Chen,
S. Oda,
K. Uchida.
Thermal-Aware Device Design of Nanoscale Bulk/SOI FinFETs: Suppression of Operation Temperature and Its Variability,
IEDM 2011,
pp. 809-812,
2011.
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T. Ohashi,
T. Takahashi,
N. Beppu,
S. Oda,
K. Uchida.
Experimental Evidence of Increased Deformation Potential at MOS Interface and Its Impact on Characteristic of ETSOI FETs,
IEDM 2011,
pp. 390-393,
2011.
Domestic Conference (Not reviewed / Unknown)
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Tsunaki Takahashi,
Nobuyasu Beppu,
陳君ろ,
SHUNRI ODA,
Ken Uchida.
バルク/SOI FinFET の自己加熱およびアナログ特性の最適化,
第61回応用物理学会春季学術講演会,
Mar. 2014.
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Tsunaki Takahashi,
Nobuyasu Beppu,
SHUNRI ODA,
Ken Uchida.
熱配慮設計によるFinFETアナログ特性の最適化,
第60回応用物理学会春季学術講演会,
2013.
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Aya Shindome,
Nobuyasu Beppu,
Tsunaki Takahashi,
SHUNRI ODA,
Ken Uchida.
架橋・非架橋構造のグラフェン抵抗変化型メモリの書込・消去特性,
第60回応用物理学会春季学術講演会,
2013.
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Tsunaki Takahashi,
Nobuyasu Beppu,
陳 君璐,
SHUNRI ODA,
Ken Uchida.
デバイスシミュレータを用いたナノスケールBulk/SOI FinFET の熱設計,
第59回応用物理学関係連合講演会,
17a-A1-9,
Mar. 2012.
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Nobuyasu Beppu,
SHUNRI ODA,
Ken Uchida.
AC コンダクタンス法及びパルスIV 法による自己発熱抑制時のSOI MOSFETドレイン電流評価,
第59回応用物理学関係連合講演会,
17a-A1-8,
Mar. 2012.
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Tsunaki Takahashi,
Nobuyasu Beppu,
SHUNRI ODA,
Ken Uchida.
デバイスシミュレータを用いたナノスケールBulk/SOI FinFET熱等価回路モデルの導出,
第73回応用物理学会学術講演会,
2012.
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Nobuyasu Beppu,
SHUNRI ODA,
Ken Uchida.
ACコンダクタンス法を用いた実験手法に対する検証,
第73回応用物理学会学術講演会,
2012.
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