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Publication List - KENJI AMAYA 2006 (27 / 523 entries)
Journal Paper
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天谷賢治,
須賀一博,
菊池竜.
0-1 整数制約条件を用いた光CT逆問題,
日本機会学会論文集A編,
Vol. 72,
No. 722,
pp. 1437-1442,
Oct. 2006.
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青木繁,
天谷賢治,
今森智史.
網目状構造物の効率的境界要素腐食解析,
日本機械学会論文集(A編),
Vol. 72,
No. 718,
pp. 830- 835,
June 2006.
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KENJI AMAYA.
Optical Computed Tomography with 0-1 Integer Constaraints,
Transactions of the Japan Society of Mechanical Engineers. A,
The Japan Society of Mechanical Engineers,
Vol. 72,
No. 722,
pp. 1437-1442,
2006.
Official location
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山川 真一,
天谷 賢治,
M. Parameswaran (Ash).
薄膜磁気センサを用いた磁場分布のナノ分解能再構成法,
計測自動制御学会論文集,
Vol. 42,
No. 6,
pp. 597-602,
2006.
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KENJI AMAYA.
332 Development of an efficient method to identify lens aberration using intensity images,
The Computational Mechanics Conference,
The Japan Society of Mechanical Engineers,
Vol. 2006,
No. 19,
pp. 417-418,
2006.
Official location
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山川 真一,
天谷 賢治,
M. Parameswaran (Ash).
薄膜スリットプローブを用いた近接場蛍光イメージの再構成法,,
計算数理工学論文集,
Vol. 6,
No. 2,
pp. 125-130,
2006.
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天谷賢治,
堀田修平,
上島正史.
強度画像からの光位相分布の同定逆問題,
日本機械学会論文集C編,
Vol. 72,
No. 717,
pp. 1478-1485,
2006.
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上島正史,
天谷賢治.
強度画像を用いた位相分布同定法の高精度化および効率化,
日本機械学会論文集C編,
Vol. 72,
No. 717,
pp. 1486-1491,
2006.
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KENJI AMAYA.
Inverse Problem of Phase Distribution Identification using Intensity Images,
Transactions of the Japan Society of Mechanical Engineers. C,
The Japan Society of Mechanical Engineers,
Vol. 72,
No. 717,
pp. 1478-1485,
2006.
Official location
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KENJI AMAYA.
An Efficient and Acculate Phase Distribution Identification from Modulated Intensity Images,
Transactions of the Japan Society of Mechanical Engineers. C,
The Japan Society of Mechanical Engineers,
Vol. 72,
No. 717,
pp. 1486-1491,
2006.
Official location
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KENJI AMAYA.
Effective Boundary Element Corrosion Analysis of Net Structure,
Transactions of the Japan Society of Mechanical Engineers. A,
The Japan Society of Mechanical Engineers,
Vol. 72,
No. 718,
pp. 830-835,
2006.
Official location
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KENJI AMAYA.
A Nano-resolution Method for Magnetic-field Reconstruction Using a Thin-film Magnetic Sensor,
SICE,
計測自動制御学会,
Vol. 42,
No. 6,
pp. 597-602,
2006.
Official location
Book
International Conference (Not reviewed / Unknown)
Domestic Conference (Not reviewed / Unknown)
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山川 真一,
天谷 賢治,
M. Parameswaran (Ash).
薄膜スリットプローブを用いた近接場蛍光イメージの再構成法,
計算数理工学シンポジウム2006,
Vol. 6,
No. 2,
pp. 125-130,
Dec. 2006.
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上島正史,
天谷賢治.
強度画像を用いた高性能収差解析手法の開発,
[No.06-9]日本機械学会第19回計算力学講演会論文集,
No.06-9]日本機械学会第19回計算力学講演会論文集,
pp417-418,
Nov. 2006.
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山川 真一,
天谷 賢治,
M. Parameswaran (Ash).
薄膜磁気センサを用いた磁場分布のナノ分解能再構成法,
日本機械学会 2006年度年次大会講演論文集,
日本機械学会 2006年度年次大会講演論文集,
Vol. 6,
pp. 109-110,
Sept. 2006.
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上島正史,
天谷賢治.
強度画像を用いた位相分布同定法の高精度化および効率化,
[No.060-1]日本機械学会関東支部第12期総会講演会講演論文集,
pp. 223-224,
Mar. 2006.
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KENJI AMAYA.
2111 Optimization of the shape of plating bath to planarize thickness of the distribution in semiconductor plating,
年次大会講演論文集 : JSME annual meeting,
The Japan Society of Mechanical Engineers,
Vol. 2006,
No. 6,
pp. 105-106,
2006.
Official location
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KENJI AMAYA.
2112 Regularization of Ill-posed Optical Computed Tomography Using Optical Absorption with Binary Constraints,
年次大会講演論文集 : JSME annual meeting,
The Japan Society of Mechanical Engineers,
Vol. 2006,
No. 6,
pp. 107-108,
2006.
Official location
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KENJI AMAYA.
2113 A nano-resolution method for magnetic-field reconstruction using a thin-film magnetic sensor,
年次大会講演論文集 : JSME annual meeting,
The Japan Society of Mechanical Engineers,
Vol. 2006,
No. 6,
pp. 109-110,
2006.
Official location
-
KENJI AMAYA.
20803 Experiment for Identification Of Electric Conductivity And Impedance Of Reinforced Concrete,
日本機械学会関東支部総会講演会講演論文集,
The Japan Society of Mechanical Engineers,
Vol. 2006,
No. 12,
pp. 215-216,
2006.
Official location
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KENJI AMAYA.
20807 An efficient and acculate phase distribution identification from modulated intensity images,
日本機械学会関東支部総会講演会講演論文集,
The Japan Society of Mechanical Engineers,
Vol. 2006,
No. 12,
pp. 223-224,
2006.
Official location
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KENJI AMAYA.
716 Development of a plating simulation method for 3-Dimensional models,
Proceedings of the ... annual meeting of JSME/MMD,
The Japan Society of Mechanical Engineers,
Vol. 2006,
pp. 409-410,
2006.
Official location
Patent
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