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Publication List - Shinjiro Iwata 2016 (4 / 14 entries)
Journal Paper
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Wenbo Lin,
Shinjiro Iwata,
Koichi Fukuda,
Yasuyuki Miyamoto.
Scaling limit for InGaAs/GaAsSb heterojunction double-gate tunnel FETs from the viewpoint of direct band-to-band tunneling from source to drain induced off-characteristics deterioration,
Japanese Journal of Applied Physics,
Vol. 55,
No. 7,
pp. 070303,
June 2016.
Official location
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Shinjiro Iwata,
Kazumi Ohashi,
Wenbo Lin,
Koichi Fukuda,
YASUYUKI MIYAMOTO.
GaAsSb/InGaAsダブルゲートンネルFET におけるソースおよびドレイン不純物濃度依存性,
電気学会論文誌C,
Vol. 136,
no. 4,
pp. 467-473,
Apr. 2016.
International Conference (Reviewed)
Domestic Conference (Not reviewed / Unknown)
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