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Publication List - Akifumi Maru (6 entries)
Journal Paper
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Akifumi Maru,
Akifumi Matsuda,
Satoshi Kuboyama,
Mamoru Yoshimoto.
Simulation-Based Understanding of “Charge-Sharing Phenomenon” Induced by Heavy-Ion Incident on a 65nm Bulk CMOS Memory Circuit,
IEICE Transactions on Electronics,
Institute of Electronics, Information and Communications Engineers (IEICE),
E105.C,
1,
47-50,
Jan. 2022.
Official location
Domestic Conference (Not reviewed / Unknown)
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Akifumi Maru,
Akifumi Matsuda,
MAMORU YOSHIMOTO.
A Study on Single Event Mitigation Techniques for Nano-Scale Semiconductor Devices,
The 79th JSAP Autumn Meeting, 2018,
Sept. 2018.
Official location
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Akifumi Maru,
Akifumi Matsuda,
MAMORU YOSHIMOTO.
A Study of Single Event Mitigation Techniques for Nano-Scale Semiconductor Devices,
The 65th JSAP Spring Meeting, 2018,
Mar. 2018.
Official location
Degree
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Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices,
Thesis,
Doctor (Engineering),
Tokyo Institute of Technology,
2021/09/24,
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Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices,
Summary,
Doctor (Engineering),
Tokyo Institute of Technology,
2021/09/24,
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Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices,
Exam Summary,
Doctor (Engineering),
Tokyo Institute of Technology,
2021/09/24,
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