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Publication List - Hiroyuki Ueyama (13 entries)
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Journal Paper
International Conference (Reviewed)
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Michihiro Shintani,
Takumi Uezono,
Tomoyuki Takahashi,
Hiroyuki Ueyama,
Takashi Sato,
Kasumi Hatayama,
Takashi Aikyo,
Kazuya Masu.
An Adaptive Test for Parametric Faults Based on Statistical Timing Information,
IEEE Asian Test Symposium,
IEEE Asian Test Symposium,
IEEE Asian Test Symposium,
pp. 151-156,
Nov. 2009.
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Takashi Sato,
Hiroyuki Ueyama,
Noriaki Nakayama,
Kazuya Masu.
A MOS transistor array with pico-ampere order precision for accurate characterization of leakage current variation,
IEEE Asian solid-state circuit conference (ASSCC),
IEEE Asian solid-state circuit conference (ASSCC),
IEEE Asian solid-state circuit conference (ASSCC),
pp. 389-392,
Nov. 2008.
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Takashi Sato,
Hiroyuki Ueyama,
Noriaki Nakayama,
Kazuya Masu.
Determination of optimal polynomial regression function to decompose on-die systematic and random variations,
ACM/IEEE Asia South Pacific Design Automation Conference (ASPDAC),
ACM/IEEE Asia South Pacific Design Automation Conference (ASPDAC),
pp. 518-523,
Jan. 2008.
Domestic Conference (Reviewed)
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Hiroyuki Ueyama,
Takashi Sato,
Noriaki Nakayama,
Kazuya Masu.
リーク電流測定用トランジスタアレイ回路の測定,
電子情報通信学会 総合大会,
電子情報通信学会 総合大会,
A-3-14,
pp. 89,
Mar. 2008.
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Hiroyuki Ueyama,
Takashi Sato,
Noriaki Nakayama,
Kazuya Masu.
閾値電圧の大域ばらつきが回路遅延ばらつきに与える影響,
STARCシンポジウム,
Sept. 2007.
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Hiroyuki Ueyama,
Takashi Sato,
Noriaki Nakayama,
Kazuya Masu.
大域ばらつきの近似次数が回路遅延ばらつきに与える影響,
電子情報通信学会ソサイエティ大会,
No. A-1-8,
pp. 8,
Sept. 2007.
International Conference (Not reviewed / Unknown)
Domestic Conference (Not reviewed / Unknown)
-
Michihiro Shintani,
Tomoyuki Takahashi,
Hiroyuki Ueyama,
takumi uezono,
Takashi Sato,
Kasumi Hatayama,
Takashi Aikyo,
Kazuya Masu.
Adaptive Test Based on Statistical Timing Information,
2009 年 電子情報通信学会総合大会,
D-10-16,
Mar. 2009.
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Takumi Uezono Tomoyuki Takahashi Hiroyuki Ueyama Michihiro Shintani Takashi Sato Kazuya Masu,
Tomoyuki Takahashi,
Hiroyuki Ueyama,
Michihiro Shintani,
Takashi Sato,
Kazuya Masu.
Critical-Path Clustering for Adaptive Test,
2009 年 電子情報通信学会総合大会,
2009 年 電子情報通信学会総合大会,
電子情報通信学会,
D-10-17,
p. 160,
Mar. 2009.
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Tomoyuki Takahashi,
Hiroyuki Ueyama,
Shiho Hagiwara,
Takashi Sato,
Kazuya Masu.
論理セル遅延の電圧・プロセスばらつき感度の検討,
電子情報通信学会ソサイエティ大会,
電子情報通信学会ソサイエティ大会,
A-3-2,
pp. 52,
Sept. 2008.
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Hiroyuki Ueyama,
Takashi Sato,
Noriaki Nakayama,
Kazuya Masu.
抵抗測定法によるトランジスタアレイ回路の測定時間短縮化,
電子情報通信学会ソサイエティ大会,
電子情報通信学会ソサイエティ大会,
C-12-41,
pp. 110,
Sept. 2008.
-
Hiroyuki Ueyama,
Takashi Sato,
Noriaki Nakayama,
Kazuya Masu.
リーク電流測定用トランジスタアレイ回路の測定,
電子情報通信学会 総合大会,
電子情報通信学会 総合大会,
pp. A-3-14,
Mar. 2008.
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