Journal Paper

• Takamasa Kawanago, Kiichi Tachi, Jaeyeol Song, Kuniyuki KAKUSHIMA, Ahmet Parhat, KAZUO TSUTSUI, Nobuyuki Sugii, takeo hattori, HIROSHI IWAI. Electrical characterization of directly deposited La-Sc oxides complex for gate insulator application, Microelectronic Engineering, Vol. 84, pp. 2335-2338, 2007.
• Y.C. Ong, D.S. Ang, K.L. Pey, S.J. O'Shea, K.E.J. Goh, C. Troadec, C.H. Thung, Takamasa Kawanago, Kuniyuki KAKUSHIMA, HIROSHI IWAI. Bilayer gate dielectric study by scanning tunneling microscopy, APPLIED PHYSICS LETTERS, Vol. 91, pp. 102905,, 2007.

International Conference (Reviewed)

• Kuniyuki Kakushima, Kouichi Okamoto, Manabu Adachi, Kiichi Tachi, Jaeyeol Song, Soushi Sato, Takamasa Kawanago, Parhat Ahmet, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai. Band Bending Measurement of HfO2/SiO2/Si Capacitor with ultra-thin La2O3 Insertion by XPS, Fifth International Symposium on Control of Semiconductor Interfaces (ISCSI2007), Nov. 2007.

Domestic Conference (Reviewed)

• 幸田みゆき, Takamasa Kawanago, Kuniyuki KAKUSHIMA, パールハット・アヘメト, KAZUO TSUTSUI, 杉井信之, takeo hattori, HIROSHI IWAI. Sc2O3ゲート絶縁膜のリーク電流機構の解析, 秋季第68回応用物理学会学術講演会, 秋季第68回応用物理学会学術講演会 講演予稿集, pp. 820, Sept. 2007.

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