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Publication List - Takashi Sato 2009 (4 / 11 entries)
Journal Paper
International Conference (Reviewed)
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Tomoyuki Takahashi,
Takumi Uezono,
Michihiro Shintani,
Kazuya Masu,
Takashi Sato.
On-die parameter extraction from path-delay measurements,
2009 IEEE Asian Solid-State Circuits Conference,
2009 IEEE Asian Solid-State Circuits Conference,
IEEE Asian Solid-State Circuits Conference,
pp. 101 - 104,
Nov. 2009.
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Michihiro Shintani,
Takumi Uezono,
Tomoyuki Takahashi,
Hiroyuki Ueyama,
Takashi Sato,
Kasumi Hatayama,
Takashi Aikyo,
Kazuya Masu.
An Adaptive Test for Parametric Faults Based on Statistical Timing Information,
IEEE Asian Test Symposium,
IEEE Asian Test Symposium,
IEEE Asian Test Symposium,
pp. 151-156,
Nov. 2009.
Domestic Conference (Not reviewed / Unknown)
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