Journal Paper

• Takumi Uezono, Takashi Sato, Kazuya Masu. One-Shot Voltage-Measurement Circuit Utilizing Process Variation, IEICE Transactions on Fundamentals of Electronics, IEICE Transactions on Fundamentals of Electronics, Vol. E92-A, No. 4, pp. 1024-1030, Apr. 2009.

International Conference (Reviewed)

• Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Hiroyuki Ueyama, Takashi Sato, Kasumi Hatayama, Takashi Aikyo, Kazuya Masu. An Adaptive Test for Parametric Faults Based on Statistical Timing Information, IEEE Asian Test Symposium, IEEE Asian Test Symposium, IEEE Asian Test Symposium, pp. 151-156, Nov. 2009.
• Tomoyuki Takahashi, Takumi Uezono, Michihiro Shintani, Kazuya Masu, Takashi Sato. On-die parameter extraction from path-delay measurements, 2009 IEEE Asian Solid-State Circuits Conference, 2009 IEEE Asian Solid-State Circuits Conference, IEEE Asian Solid-State Circuits Conference, pp. 101 - 104, Nov. 2009.

Domestic Conference (Reviewed)

• Takanori Date, Shiho Hagiwara, takumi uezono, Takashi Sato, Kazuya Masu. SRAM回路の構造的対称性を考慮した2段階学習型重点的サンプリング, VLSI設計技術研究会 システム設計及び一般, VLSI設計技術研究会 システム設計及び一般，信学技報, VLSI設計技術研究会 システム設計及び一般, vol. 109, no. 34, pp. 37-42, May 2009.

Domestic Conference (Not reviewed / Unknown)

• Tomoyuki Takahashi, takumi uezono, Hiroyuki Ochi, Kazuya Masu, Takashi Sato. パス遅延測定によるチップ特性の推定手法, DAシンポジウム, DAシンポジウム, DAシンポジウム, pp. 133-138, Aug. 2009.
• Takumi Uezono Tomoyuki Takahashi Hiroyuki Ueyama Michihiro Shintani Takashi Sato Kazuya Masu, Tomoyuki Takahashi, Hiroyuki Ueyama, Michihiro Shintani, Takashi Sato, Kazuya Masu. Critical-Path Clustering for Adaptive Test, 2009 年 電子情報通信学会総合大会, 2009 年 電子情報通信学会総合大会, 電子情報通信学会, D-10-17, p. 160, Mar. 2009.
• Michihiro Shintani, Tomoyuki Takahashi, Hiroyuki Ueyama, takumi uezono, Takashi Sato, Kasumi Hatayama, Takashi Aikyo, Kazuya Masu. Adaptive Test Based on Statistical Timing Information, 2009 年 電子情報通信学会総合大会, D-10-16, Mar. 2009.

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